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Precision projector | ||
| Model | VS-320 | ||
| Manufacturer | Shiko Seiki | ||
| Specified precision | Measurement magnifications of ×10,×20,×100 | ||
| Peripheral equipment | QC2002-dimensional data processor | ||
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Universal thickness meter | ||
| Model | LZ-200C | ||
| Manufacturer | Kett Electric Laboratory | ||
| Specified precision | Measurement range of 0 to 30 mm | ||
| Peripheral equipment | ー | ||
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Surface roughness and shape tester | ||
| Model | Surf Com 204B | ||
| Manufacturer | Tokyo Seimitsu | ||
| Specified precision | Recording magnification of x100 to x100,000 vertically, x0.5 to x2,000 horizontally | ||
| Peripheral equipment | ー | ||
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Vickers hardness tester | ||
| Model | AVK | ||
| Manufacturer | Akashi Seisakusho | ||
| Specified precision | 1 to 50kg | ||
| Peripheral equipment | ー | ||
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Rockwell superficial hardness tester | ||
| Model | 3R-S | ||
| Manufacturer | Nakai Precision Machinery Manufacturing | ||
| Specified precision | 3 to 45kg | ||
| Peripheral equipment | ー | ||
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Rockwell hardness tester | ||
| Model | ー | ||
| Manufacturer | Matsuzawa Seiki | ||
| Specified precision | 10 to 150kg | ||
| Peripheral equipment | ー | ||
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Ultrasonic flaw detector | ||
| Model | FD-650 | ||
| Manufacturer | Mitsubishi Electric | ||
| Specified precision | Capacity :10 to 10,000mm sensitivity : 100dB or higher | ||
| Peripheral equipment | ー | ||
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5 kN Tensile tester | ||
| Model | AGS-H | ||
| Manufacturer | Shimadzu | ||
| Specified precision | 100N to 5kN | ||
| Peripheral equipment | ー | ||
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10 kN Tensile tester | ||
| Model | FSP-1000 | ||
| Manufacturer | Fujii Seiki | ||
| Specified precision | 50N to 10kN | ||
| Peripheral equipment | ー | ||
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100 kN Tensile tester | ||
| Model | Ansler type | ||
| Manufacturer | Tansui Kikai | ||
| Specified precision | 200N to 100kN | ||
| Peripheral equipment | ー | ||
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Metallographic microscope | ||
| Model | HFX-DX | ||
| Manufacturer | Nikon | ||
| Specified precision | Magnification : ×50 to ×1000 | ||
| Peripheral equipment | ACT-2U digital camera control unit | ||
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Electron microscope | ||
| Model | S-3000H | ||
| Manufacturer | Hitachi High Technologies | ||
| Specified precision | Magnification : ×15 to ×300,000 | ||
| Peripheral equipment | S-3000N energy dispersive x-ray spectrometer | ||
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Microscope | ||
| Model | VHX-500 | ||
| Manufacturer | Keyence | ||
| Specified precision | Magnification : ×5 to ×3000 | ||
| Peripheral equipment | VHX-S15 3D automated measurement unit | ||
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Conductivity tester | ||
| Model | Metal Condux 2010 | ||
| Manufacturer | Denshi Keisoku Kogyo | ||
| Specified precision | Within 7% of indication | ||
| Peripheral equipment | ー | ||
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Knoop hardness tester | ||
| Model | M-102 | ||
| Manufacturer | Akashi | ||
| Specified precision | 10g to 1.0kg | ||
| Peripheral equipment | iDP3110 printer | ||
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Comparator (measurement microscope) | ||
| Model | MODELⅡ | ||
| Manufacturer | Nikon | ||
| Specified precision | Measurement range : 0 to 30mm | ||
| Peripheral equipment | DP-1VR mini-processor | ||
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Fluorescent x-ray film thickness gauge | ||
| Model | SFT-7000 | ||
| Manufacturer | Seiko Instruments | ||
| Specified precision | Measurement range : 0 to 100µm | ||
| Peripheral equipment | ー | ||
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Solar simulator | ||
| Model | YSS-150A | ||
| Manufacturer | Yamashita Denso | ||
| Specified precision | Spectral characteristic of AM 1.5, irradiation area of 150 x 150 mm | ||
| Peripheral equipment | ー | ||
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Ultrasonic wire bonder | ||
| Model | SW-1-7K | ||
| Manufacturer | Ultrasonic Engineering | ||
| Specified precision | Aluminum wire diameter : 20 to 75µm |
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| Peripheral equipment | UJ-246-1C pull tester | ||
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Thermographic camera | ||
| Model | AdvancedThermoTVS-500 |
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| Manufacturer | Nippon Avionics | ||
| Specified precision | Measurement range of -40°C to 500°C, temperature precision of ±2°C detection wavelength of 8 to 14 μm |
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| Peripheral equipment | ー | ||
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